Challenges in analog and mixed-signal fault models

被引：28
作者：
Soma, M
机构：
[1] Department of Electrical Engineering, University of Washington, Seattle, WA
来源：
IEEE CIRCUITS AND DEVICES MAGAZINE | 1996年 / 12卷 / 01期
关键词：
D O I：
10.1109/101.481204
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：16 / 19
页数：4
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