Challenges in analog and mixed-signal fault models

[1] Abramovici M, 1990, DIGITAL SYSTEMS TEST

[2] BEH CC, 1982, NOV P IEEE TEST C, P35

[3] BENHAMIDA N, 1993, P IEEE INT TEST C

[4] BISHOP A, UNPUB IEEE T CAS

[5] TIME-DOMAIN TESTING STRATEGIES AND FAULT-DIAGNOSIS FOR ANALOG SYSTEMS [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (01) : 157 - 162

[6] TEST ROUTINES BASED ON SYMBOLIC LOGICAL STATEMENTS [J]. JOURNAL OF THE ACM, 1959, 6 (01) : 33 - 36

[7] RADIAL YIELD VARIATIONS IN SEMICONDUCTOR WAFERS [J]. IEEE CIRCUITS AND DEVICES MAGAZINE, 1987, 3 (02): : 42 - 47

[8] MODELING THE CRITICAL AREA IN YIELD FORECASTS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 874 - 878

[9] DEFECT SIZE VARIATIONS AND THEIR EFFECT ON THE CRITICAL AREA OF VLSI DEVICES [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 878 - 880

[10] GALIAY J, 1980, IEEE T COMPUT, V29, P527, DOI 10.1109/TC.1980.1675614

[1] Abramovici M, 1990, DIGITAL SYSTEMS TEST

[2] BEH CC, 1982, NOV P IEEE TEST C, P35

[3] BENHAMIDA N, 1993, P IEEE INT TEST C

[4] BISHOP A, UNPUB IEEE T CAS

[5] TIME-DOMAIN TESTING STRATEGIES AND FAULT-DIAGNOSIS FOR ANALOG SYSTEMS [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (01) : 157 - 162

[6] TEST ROUTINES BASED ON SYMBOLIC LOGICAL STATEMENTS [J]. JOURNAL OF THE ACM, 1959, 6 (01) : 33 - 36

[7] RADIAL YIELD VARIATIONS IN SEMICONDUCTOR WAFERS [J]. IEEE CIRCUITS AND DEVICES MAGAZINE, 1987, 3 (02): : 42 - 47

[8] MODELING THE CRITICAL AREA IN YIELD FORECASTS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 874 - 878

[9] DEFECT SIZE VARIATIONS AND THEIR EFFECT ON THE CRITICAL AREA OF VLSI DEVICES [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 878 - 880

[10] GALIAY J, 1980, IEEE T COMPUT, V29, P527, DOI 10.1109/TC.1980.1675614