Two-component photoluminescence decay in InGaN/GaN multiple quantum well structures

被引:0
|
作者
Feng, SW
Cheng, YC
Liao, CC
Chung, YY
Liu, CW
Yang, CC
Lin, YS
Ma, KJ
Chyi, JI
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10764, Taiwan
[2] Natl Taiwan Univ, Grad Inst Electro Opt Engn, Taipei 10764, Taiwan
[3] Chung Cheng Inst Technol, Dept Engn Mech, Tahsi, Taoyuan, Taiwan
[4] Natl Cent Univ, Dept Elect Engn, Taipei, Taiwan
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2001年 / 228卷 / 01期
关键词
D O I
10.1002/1521-3951(200111)228:1<121::AID-PSSB121>3.0.CO;2-I
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Two-component decay of time-resolved photo luminescence (TRPL) intensity in three InGaN/GaN multiple quantum well samples were observed. The first-decay component was attributed to exciton relaxation of free-carrier and localized states; the second-decay one was dominated by the relaxation of localized excitons. The second-decay lifetime was related to the extent of carrier localization or indium aggregation and phase separation. The lifetime of free-carrier states was connected with the defect density. Based on the temperature-dependent data of PL and stimulated emission (SE), the localization energies of the three samples were calibrated to show the consistent trend with the second-decay lifetime and previous material analyses.
引用
收藏
页码:121 / 124
页数:4
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