Generalized Multiple Dependent State Sampling Plans in Presence of Measurement Data

被引：14

作者：

Bhattacharya, Ritwik ^{[1
]}

Aslam, Muhammad ^{[2
]}

机构：

[1] Tecnol Monterrey, Sch Engn & Sci, Monterrey 64849, Mexico

[2] King Abdulaziz Univ, Fac Sci, Dept Stat, Jeddah 21551, Saudi Arabia

来源：

IEEE ACCESS | 2020年 / 8卷

关键词：

Inspection; Testing; Indexes; Production; Exponential distribution; Performance analysis; Estimation; Consumer's risk; hybrid censoring; life-testing; producer's risk; quality control; reliability sampling plan;

D O I：

10.1109/ACCESS.2020.3021504

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This article introduces a generalized version of the multiple dependent state sampling plan based on the measurement data, that is, when the quality characteristic is measured in a numerical scale. The conditions of application and the operating procedures of the proposed plan are discussed sequentially. A few important performance measures, such as operating characteristic curve, average total inspection and average sample number, are developed. The advantage of the proposed plan over the multiple dependent state sampling and single sampling plan is demonstrated through numerical example. Finally, one real-life data set is analyzed to illustrate the application of the proposed sampling plan.

引用

页码：162775 / 162784

页数：10

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