Dopants incorporation in ZnO mechanical milled powders sensed by positrons

被引：3

作者：

Damonte, L. C. ^{[1
]}

Donderis, V. ^{[1
]}

Hernandez Fenollosa, M. A. ^{[1
]}

机构：

[1] Univ Politecn Valencia, Dept Fis Aplicada, E-46071 Valencia, Spain

来源：

HYPERFINE INTERACTIONS | 2007年 / 179卷 / 1-3期

关键词：

Mechanical milling; Doped-ZnO; Positron annihilation; Nanocrystalline semiconductors;

D O I：

10.1007/s10751-008-9673-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

M-doped ZnO (M: Cd, Mg) powders obtained by mechanical milling were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and positron lifetime annihilation spectroscopy (PALS). The mixing of the oxides is followed by means of XRD and SEM. As milling proceeds, a clear reduction of grain size and homogenization are observed. The evolution of annihilation parameters with milling time and cation content were analyzed and related with the kind of mechanical induced defect involved. Ternary oxides Zn(1-x)M(x)O were efficiency obtained for certain compositions. The results showed that positrons constitute a well suited probe to characterize the cation substitution in the ZnO oxide lattice.

引用

页码：73 / 79

页数：7

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