A Radial Scanning Statistic for Selecting Space-filling Designs in Computer Experiments
被引:2
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作者:
Roustant, Olivier
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机构:
Ecole Natl Super Mines, 158 Cours Fauriel, St Etienne, FranceEcole Natl Super Mines, 158 Cours Fauriel, St Etienne, France
Roustant, Olivier
[1
]
Franco, Jessica
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机构:
Total, Pau, FranceEcole Natl Super Mines, 158 Cours Fauriel, St Etienne, France
Franco, Jessica
[2
]
Carraro, Laurent
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机构:
Telecom St Etienne, St Etienne, FranceEcole Natl Super Mines, 158 Cours Fauriel, St Etienne, France
Carraro, Laurent
[3
]
Jourdan, Astrid
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机构:
Ecole Int Sc Trait Inform, Pau, FranceEcole Natl Super Mines, 158 Cours Fauriel, St Etienne, France
Jourdan, Astrid
[4
]
机构:
[1] Ecole Natl Super Mines, 158 Cours Fauriel, St Etienne, France
[2] Total, Pau, France
[3] Telecom St Etienne, St Etienne, France
[4] Ecole Int Sc Trait Inform, Pau, France
来源:
MODA 9 - ADVANCES IN MODEL-ORIENTED DESIGN AND ANALYSIS
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2010年
关键词:
D O I:
10.1007/978-3-7908-2410-0_25
中图分类号:
O21 [概率论与数理统计];
C8 [统计学];
学科分类号:
020208 ;
070103 ;
0714 ;
摘要:
In the study of computer codes, filling space as uniformly as possible is important to describe the complexity of the investigated phenomenon. However, this property is not conserved by reducing the dimension. Some numeric experiment designs are conceived in this sense as Latin hypercubes or orthogonal arrays, but they consider only the projections onto the axes or the coordinate planes. We introduce a statistic which allows studying the good distribution of points according to all 1-dimensional projections. By angularly scanning the domain, we obtain a useful graphical representation. The advantages of this new tool are demonstrated on usual space-filling designs. Graphical, decisional and dimensionality issues are discussed.
机构:
Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
机构:
Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Joseph, V. Roshan
Gu, Li
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机构:
Amazon Com Inc, Seattle, WA USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Gu, Li
Ba, Shan
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机构:
Procter & Gamble Co, Quantitat Sci, Mason, OH USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Ba, Shan
Myers, William R.
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机构:
Procter & Gamble Co, Quantitat Sci, Mason, OH USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
机构:
Univ Calif Los Angeles, Dept Stat, 8125 Math Sci Bldg,Box 951554, Los Angeles, CA 90095 USAUniv Calif Los Angeles, Dept Stat, 8125 Math Sci Bldg,Box 951554, Los Angeles, CA 90095 USA
Tian, Ye
Xu, Hongquan
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机构:
Univ Calif Los Angeles, Dept Stat, 8125 Math Sci Bldg,Box 951554, Los Angeles, CA 90095 USAUniv Calif Los Angeles, Dept Stat, 8125 Math Sci Bldg,Box 951554, Los Angeles, CA 90095 USA