Ballistic emission microscopy studies on metal-molecule interfaces

被引：5
作者：
Chandrasekhar, N. [1 ]
机构：
[1] Inst Mat Res & Engn, Singapore 117602, Singapore
来源：
JOURNAL OF PHYSICS-CONDENSED MATTER | 2008年 / 20卷 / 37期
关键词：
D O I：
10.1088/0953-8984/20/37/374113
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Ballistic electron emission microscopy (BEEM) experiments on metal-molecule interfaces are briefly reviewed. Results of BEEM experiments with two different orientations of molecules are presented and discussed. Significant differences in uniformity of transport through the molecular layer are found. Implications for device applications are briefly discussed.
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页数：10
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