Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

被引：56
|
作者：
Mandula, Ondrej [1 ]
Kielhorn, Martin [3 ,4 ]
Wicker, Kai [2 ,3 ]
Krampert, Gerhard [5 ]
Kleppe, Ingo [6 ]
Heintzmann, Rainer [2 ,3 ,4 ]
机构：
[1] Univ Edinburgh, Inst Adapt & Neural Computat, Edinburgh, Midlothian, Scotland
[2] Univ Jena, Inst Phys Chem, D-6900 Jena, Germany
[3] Inst Photon Technol, Jena, Germany
[4] Kings Coll London, Randall Div, London WC2R 2LS, England
[5] Carl Zeiss, Corp Res & Technol, D-07745 Jena, Germany
[6] Carl Zeiss Microscopy GmbH, D-07745 Jena, Germany
来源：
OPTICS EXPRESS | 2012年 / 20卷 / 22期
关键词：
EXCITATION MICROSCOPY; PATTERNED EXCITATION; RESOLUTION; IMPROVEMENT;
D O I：
10.1364/OE.20.024167
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure. (C) 2012 Optical Society of America
引用
收藏
页码：24167 / 24174
页数：8
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