Growth of single-domain GaN layers on Si(001) by metalorganic vapor-phase epitaxy

被引:29
作者
Schulze, F [1 ]
Dadgar, A [1 ]
Bläsing, J [1 ]
Hempel, T [1 ]
Diez, A [1 ]
Christen, J [1 ]
Krost, A [1 ]
机构
[1] Univ Magdeburg, Fak Nat Wissensch, Inst Expt Phys, D-39016 Magdeburg, Germany
关键词
characterization; crystal structure; substrates; X-ray diffraction; metalorganic vapour-phase epitaxy; nitrides;
D O I
10.1016/j.jcrysgro.2005.12.073
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Highly oriented wurtzite-type GaN layers were grown on Si(001) substrates by metalorganic vapor-phase epitaxy. The use of a high-temperature AlN seed layer at more than 1100 degrees C allows growing solely c-axis-oriented crystallites. However, due to the symmetry of the Si(001) surface two in-plane alignments of the GaN occur, twisted by 30 degrees. Therefore, to obtain a coalesced GaN surface, the selection of only one certain orientation is necessary. The approach of 4 degrees off-oriented substrates enabled to grow a flat, highly mono-oriented GaN layer on Si(001), with both kinds of in-plane alignments realizable. The crystalline quality of the GaN was investigated by X-ray analysis and scanning electron microscopy. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:485 / 488
页数:4
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