Electron profile stiffness and critical gradient studies

被引:52
作者
DeBoo, J. C. [1 ]
Petty, C. C. [1 ]
White, A. E. [2 ]
Burrell, K. H. [1 ]
Doyle, E. J. [3 ]
Hillesheim, J. C. [3 ]
Holland, C. [4 ]
McKee, G. R. [5 ]
Rhodes, T. L. [3 ]
Schmitz, L. [3 ]
Smith, S. P. [1 ]
Wang, G. [3 ]
Zeng, L. [3 ]
机构
[1] Gen Atom Co, San Diego, CA 92186 USA
[2] MIT, Cambridge, MA 02139 USA
[3] Univ Calif Los Angeles, Los Angeles, CA 90095 USA
[4] Univ Calif San Diego, La Jolla, CA 92093 USA
[5] Univ Wisconsin, Madison, WI 53706 USA
关键词
TRANSPORT;
D O I
10.1063/1.4750061
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Electron profile stiffness was studied in DIII-D L-mode discharges by systematically varying the heat flux in a narrow region with electron cyclotron heating and measuring the local change produced in del T-e. Electron stiffness was found to slowly increase with toroidal rotation velocity. A critical inverse temperature gradient scale length 1/L-C similar to 3 m(-1) was identified at rho = 0.6 and found to be independent of rotation. Both the heat pulse diffusivity and the power balance diffusivity, the latter determined by integrating the measured dependence of the heat pulse diffusivity on -del T-e, were fit reasonably well by a model containing a critical inverse temperature gradient scale length and varying linearly with 1/L-T above the threshold. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4750061]
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页数:8
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