3D image reconstruction using optical sectioning in confocal scanning microscopy

被引:1
作者
Seo, JW [1 ]
Kang, DK [1 ]
Park, SL [1 ]
Gweon, DG [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Mech Engn, Yusong Gu, Taejon 305701, South Korea
来源
OPTOMECHATRONIC SYSTEMS II | 2001年 / 4564卷
关键词
confocal scanning microscopy (CSM); optical sectioning; image extinction; AO deflector; unitary lens;
D O I
10.1117/12.444112
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Confocal scanning microscopy (CSM) has been used in biological application, materials science, semiconductor quality measurement and other non-destructive microscopic application. Small spot of fight illuminates a sample, and a small detector that is ideally a point detector collects the reflected or transmitted light having the information of specimen. An image distribution can be reconstructed by a correlation analysis of spots with the high bandwidth. The mechanism for two-dimensional beam scanning and optical sectioning has an important role in CSM as the three-dimensional profiler. The parasitic motion of focus on the detector gives rise to the fatal distortion of an image profile named the extinction effect while using acousto-optical (AO) deflector. We propose the progressive methods for the high quality image as the following. At first, for having the corrected image, small spot and long scan range, this paper shows that the optimal design having the multi-objects can be used by choosing the unitary lens device in CSM. At second, in order to compensate for the intensity cancellation at the end profile that may be the cause of waviness for the optical image, this paper shows that it is efficient to schedule the frequency of scan. According to characteristics of the extinction curve and axial/lateral response having the error property, we can define the frequency and sensitivity of as their robustness. Finally, the axial response gives an important motive for the optical section, and the limit of object depth. The edge enhancement may be a fatal defeat to the reconstruction of image and sensitive to the conditions of specimen such as slope, irregular reflectivity, shape, etc. That means that the intensity profile for the open loop scanning method should be matched with its response to a perfect mirror as specimen, which can be minimized with the optical sectioning or the optical probe of the closed loop control.
引用
收藏
页码:58 / 65
页数:8
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