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A pragmatic approach to test generation
被引：0
作者：
Perez, E
Algaba, E
Monedero, M
机构：
来源：
TESTING OF COMMUNICATING SYSTEMS, VOL 10
|
1997年
关键词：
test generation;
SDL;
MSC;
ISO;
9646;
TTCN;
coverage;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a pragmatic approach to the problem of the automatic generation of a test suite for a given system. It introduces the GAP tool, embedded in the HARPO toolkit, which is capable of generating TTCN test suites starting from a SDL specification of the system and test purposes written in MSC notation. In addition to this, GAP computes coverage measures for these tests, which represent an evaluation of their quality.
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收藏
页码：365 / 380
页数：4
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