Young's modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation

被引:7
作者
Khalisov, M. M. [1 ,2 ]
Lebedev, V. A. [3 ]
Poluboyarinov, A. S. [4 ]
Garshev, A., V [4 ]
Khrapova, E. K. [1 ]
Krasilin, A. A. [1 ]
Ankudinov, A., V [1 ]
机构
[1] Ioffe Inst, Politekhnicheskaya 26, St Petersburg 194021, Russia
[2] Russian Acad Sci, Pavlov Inst Physiol, Makarova Emb 6, St Petersburg 199034, Russia
[3] Univ Limerick, Limerick V94 T9PX, Ireland
[4] Lomonosov Moscow State Univ, GSP 1, Moscow 119991, Russia
来源
NANOSYSTEMS-PHYSICS CHEMISTRY MATHEMATICS | 2021年 / 12卷 / 01期
基金
俄罗斯科学基金会;
关键词
AFM; in-situ TEM; nanomechanics; indentation; Young's modulus; ELASTIC-MODULUS; CATALYSTS; COMPOSITES;
D O I
10.17586/2220-8054-2021-12-1-118-127
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Ni3Si2O5(OH)(4) phyllosilicate nanoscrolls were investigated by two techniques: the bending-based test method of AFM and the indentation method with visual control in STEM. In the first case, the average measured Young's modulus, about 200 GPa, turned out to be significantly higher than in the second one, 40 GPa. The reasons for this discrepancy are analyzed.
引用
收藏
页码:118 / 127
页数:10
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