Photoresponse of homostructure WSe2 rectifying diode

被引:10
|
作者
Peng, Tien-Hsin [1 ]
Hong, Chung-Hung [1 ,2 ]
Tang, Ming-Ru [1 ,2 ]
Lee, Si-Chen [1 ,2 ]
机构
[1] Natl Taiwan Univ, Grad Inst Elect Engn, Dept Elect Engn, Taipei 10617, Taiwan
[2] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 10617, Taiwan
关键词
OPTOELECTRONICS;
D O I
10.1063/1.5115423
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The WSe2 homostructure rectifying diode is demonstrated, p-type and n-type WSe2 regions were formed by adopting different layer WSe2 thicknesses. Typically, the common way to fabricate two dimensional material based diode is to use heterostructure by stacking two different carrier type and band gap energies materials. However, there is always lattice mismatch at the junction, leading to the degraded photoresponse of the diodes. In order to reduce the problems of heterostructure diode, layer thickness dependent band gap energy of WSe2 is reported and applied to fabricate homostructure diode. The ideality factor of the current-voltage characteristic is 1.64 and the current rectification ratio can reach to 10(3). The optical properties of the diode, including fill factor 45.7%, responsivity 16.02 mA/W and EQE 3.06% are reported. It is concluded that the WSe2 homojunction diode can be applied in photodetectors, switches, solar cells etc.
引用
收藏
页数:5
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