Texture evolution and mechanical properties of ion-irradiated Au thin films

被引:14
作者
Dietiker, Marianne [1 ]
Olliges, Sven [1 ]
Schinhammer, Michael [1 ]
Seita, Matteo [1 ]
Spolenak, Ralph [1 ]
机构
[1] ETH, Dept Mat, Lab Nanomet, CH-8093 Zurich, Switzerland
关键词
Thin films; Microstructure; Ion-beam processing; Electron backscattering diffraction; Nanoindentation; INDUCED GRAIN-GROWTH; SINGLE-CRYSTALS; DEFECTS; COPPER; BEHAVIOR; HARDNESS; SILICON; FCC;
D O I
10.1016/j.actamat.2009.04.042
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microstructure control of thin films is of particular importance for improving the reliability of microdevices in terms of electromigration, fatigue damage and hillocking. High-energy ion bombardment has turned out to be an appropriate modification instrument as it leads to selective grain growth, resulting in single-crystal-like structures. The current work addresses the effect of 7 MeV Au+ and 1.5 MeV N+ irradiation at high fluences (up to 45 x 10(16) ions cm(-2)) on the microstructure and the mechanical properties of 500 nm Au thin films of small initial grain size (70-90 nm). The following microstructure changes were observed: selective grain growth, texture changes, sputtering, interfacial degradation, formation of geometrically necessary dislocations, and defect clusters. Hardening behavior was found to be a consequence of grain growth (Hall-Petch effect) and the formation of ion-induced defects. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:4009 / 4021
页数:13
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