Small-angle electron scattering of magnetic fine structures

被引:12
作者
Togawa, Yoshihiko [1 ,2 ]
机构
[1] Osaka Prefecture Univ, Res Inst Twenty First Century, N2RC, Naka Ku, Sakai, Osaka 5998570, Japan
[2] Japan Sci & Technol Corp JST, CREST, Chiyoda Ku, Tokyo 1020075, Japan
基金
日本学术振兴会;
关键词
small-angle electron scattering (SAES); magnetic artificial lattice; chiral magnetic order; chiral magnet; Lorentz deflection; Bragg diffraction; PHASE; DIFFRACTION; RESOLUTION; SUPERLATTICES; TRANSPORT; BINARY; IMAGE;
D O I
10.1093/jmicro/dft007
中图分类号
TH742 [显微镜];
学科分类号
摘要
Magnetic structures in magnetic artificial lattices and chiral magnetic orders in chiral magnets have been quantitatively analyzed in the reciprocal space by means of small-angle electron scattering (SAES) method. Lorentz deflection due to magnetic moments and Bragg diffraction due to periodicity are simultaneously recorded at an angle of the order of or less than 1 x 10(-6) rad, using a camera length of more than 100 m. The present SAES method, together with TEM real-space imaging methods such as in-situ Lorentz microscopy, is very powerful in analyzing magnetic fine structures in magnetic materials. Indeed, the existence of both a chiral helimagnetic structure and a chiral magnetic soliton lattice in a chiral magnet CrNb3S6 has been successfully verified for the first time using the present complementary methods.
引用
收藏
页码:S75 / S86
页数:12
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