Topographical observation of silane-treated inorganic surface using atomic force microscopy

被引:14
作者
Nakamura, Y
Yokouchi, N
Tobita, Y
Iida, T
Nagata, K
机构
[1] Osaka Inst Technol, Dept Appl Chem, Asahi Ku, Osaka 5358585, Japan
[2] Osaka Inst Technol, Bio Venture Ctr, Asahi Ku, Osaka 5358585, Japan
[3] Ind Technol Ctr, Okayama 7011296, Japan
关键词
silane coupling agent; topography; surface treatment; atomic force microscopy; mica;
D O I
10.1163/156855405774327911
中图分类号
TB33 [复合材料];
学科分类号
摘要
The topography of the silane-treated layer on an inorganic surface was observed using an atomic force microscope. For this purpose, the cleaved mica plate was treated with some silane coupling agent at varying conditions. The silanes having aminopropyl or methacryloxypropyl group as organofunctional groups with di- or trialkoxyl structures were used. Three different solvents for silane solution - 2-propanol, 2-propanol/water mixture and water - were used. The pH of the aqueous solution was controlled. As a result, the most suitable solvent and pH in order to obtain smooth silane layer was clarified. The solubility of silane molecules in the solution, the wettability of silane molecule onto inorganic surface, and prevention of the mutual condensation of silane molecules in the solution were found to be important parameters for this purpose.
引用
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页码:669 / 681
页数:13
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