Structured Puncturing for Rate-Compatible B-LDPC Codes with Dual-Diagonal Parity Structure

被引：10

作者：

Park, Hyo Yol ^{[1
]}

Kim, Kwang Soon ^{[1
]}

Kim, Dong Ho ^{[2
]}

Whang, Keum Chan ^{[1
]}

机构：

[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul 120749, South Korea

[2] Seoul Natl Univ Technol, Dept Media Engn, Seoul 139743, South Korea

来源：

IEEE TRANSACTIONS ON WIRELESS COMMUNICATIONS | 2008年 / 7卷 / 10期

关键词：

Block-type LDPC code; rate-compatible code; hybrid;

D O I：

10.1109/T-WC.2008.070409

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we propose a generalized formula for generating puncturing patterns for block-type low-density parity-check (B-LDPC) codes with dual-diagonal parity structure. The proposed formula distributes punctured bits uniformly in the zigzag edge connections, as well as maximizes the minimum recovery speed and the reliability of each punctured node. Also, the proposed puncturing can be applied to any B-LDPC code with dual-diagonal parity structure and can provide efficient bitwise puncturing patterns even when the number of puncturing bits is not equal to an integer multiple of the block size. Simulation results show that the proposed punctured B-LDPC codes are better than existing punctured B-LDPC codes and even dedicated B-LDPC codes used in commercial standards.

引用

页码：3692 / 3696

页数：5

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