INNOVATVE ACID COPPER PROCESS FOR SIMULTANEOUSLY FILLING VIAS AND PLATING THROUGH HOLES

被引:0
作者
Nikolova, Maria [1 ]
Rodriguez, Confesol [1 ]
Bowerman, William [1 ]
Watkowski, Jim [1 ]
Feng, Kesheng [1 ]
机构
[1] MacDemid Enthone Elect Solut, 227 Freight St, Waterbury, CT 06702 USA
来源
2017 12TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT) | 2017年
关键词
ADDITIVES;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper relates to copper plating processes in the manufacturing of printed circuit boards, IC substrates, and semiconducting devices for electronic applications. The complex circuit hoard designs require simultaneously tilling of via structures and plating through holes (TH). This is highly challenging since the commonly used electrolytes for tilling vias are not suitable for plating of the through holes and vice versa. The requirements include filling BMV, while depositing no more than 18 - 20 mu m of copper onto the planar substrate areas, dimple no more than 10 mu m, and micro-distribution for the plated TH > 75 %. The described DC acid copper plating process is designed for simultaneously filling blind micro-vias and plating through holes across a variety of geometries in a variety of equipment applications with insoluble anodes, including vertical continuous plating equipment, VCP. The bath produces a bright, fine grained, ductile deposit. The thermal and physical mechanical properties of the copper deposits are excellent. Tensile strength > 42,000 psi and elongation > 20 % had been measured for deposits plated in a fresh and in an aged bath. The organic additive ranges have been optimized. All bath components are CVS analyzable and the electrolyte has an extremely long life.
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页码:107 / 110
页数:4
相关论文
共 12 条
  • [1] Bari G.A., 2010, Modern electroplating, V5th
  • [2] Coombs C.F., 2008, Printed Circuit Handbook
  • [3] Enhancement of filling performance of a copper plating formula at low chloride concentration
    Dow, Wei-Ping
    Yen, Ming-Yao
    Liu, Cheng-Wei
    Huang, Chen-Chia
    [J]. ELECTROCHIMICA ACTA, 2008, 53 (10) : 3610 - 3619
  • [4] Dubin V.M., 1998, MAT RES SOC, P405
  • [5] THE CHEMISTRY OF THE ADDITIVES IN AN ACID COPPER ELECTROPLATING BATH .3. THE MECHANISM OF BRIGHTENING BY 4,5-DITHIAOCTANE-1,8-DISULFONIC ACID
    HEALY, JP
    PLETCHER, D
    GOODENOUGH, M
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1992, 338 (1-2): : 179 - 187
  • [6] Horkans J., 2000, ECS P EL PROC ULSI F, V8, P103
  • [7] Leveling and microstructural effects of additives for copper electrodeposition
    Kelly, JJ
    Tian, CY
    West, AC
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (07) : 2540 - 2545
  • [8] Copper electroplating technology for microvia filling
    Lefebvre, Mark
    Allardyce, George
    Seita, Masaru
    Tsuchida, Hideki
    Kusaka, Masaru
    Hayashi, Shinjiro
    [J]. Circuit World, 2003, 29 (02) : 9 - 14
  • [9] Modelling of Faradaic current profiles during pulse reverse plating
    Pearson, T
    [J]. TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING, 2005, 83 (04): : 171 - 180
  • [10] A method for microvia-fill process modeling in a cu plating system with additives
    Pohjoranta, A.
    Tenno, R.
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2007, 154 (10) : D502 - D509