Manufacturer variability of enhanced low dose rate sensitivity (ELDRS) in a voltage comparator

被引：5
|
作者：
Krieg, J [1 ]
Tuflinger, T [1 ]
Pease, R [1 ]
机构：
[1] NAVSEA Crane, Crane, IN 47522 USA
来源：
2001 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 2001年
关键词：
D O I：
10.1109/REDW.2001.960468
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The variability in total dose response of a voltage comparator from five manufacturers is examined. The total dose degradation of input bias current varies by a factor of 100 among manufacturers and only three of the five exhibit ELDRS.
引用
收藏
页码：167 / 171
页数：5
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