Implication logic gates using spin-transfer-torque-operated magnetic tunnel junctions for intrinsic logic-in-memory

被引:57
作者
Mahmoudi, Hiwa [1 ]
Windbacher, Thomas [1 ]
Sverdlov, Viktor [1 ]
Selberherr, Siegfried [1 ]
机构
[1] Vienna Univ Technol, Inst Microelect, A-1040 Vienna, Austria
基金
欧洲研究理事会;
关键词
Logic-in-memory; Material implication (IMP); Magnetic tunnel junction (MTJ); Non-volatile logic; Spin-transfer torque (SIT);
D O I
10.1016/j.sse.2013.02.017
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As the feature size of CMOS components scales down, the standby power losses due to high leakage currents have become a top concern for modern circuit design. Introducing non-volatility in logic circuits allows to overcome the standby power issue. Magnetic tunnel junctions (MTJs) offer a great potential, because of their non-volatility, unlimited endurance, CMOS compatibility, and fast switching speed. This work proposes current- and voltage-controlled MTJ-based implication (IMP) logic gtes for future non-volatile logic-in-memory architecture. The MTJ-based implication logic realizes an intrinsic logic-in-memory known as "stateful" logic for which the MTJ devices serve simultaneously as memory elements and logic gates. Spintronic implication logic gates are analyzed by using a SPICE model for spin-transfer torque (SIT) MTJs in order to show the reliability of the IMP operation. It has been demonstrated that the proposed current-controlled implication gate offers a higher performance (power and reliability) than the conventional voltage-controlled one. The realization of the spintronic stateful logic operations extends non-volatile electronics from memory to logical computing applications and opens the door for more complex logic functions to be realized with MTJ-based devices. We present a stateful logic circuit based on the common STF-MRAM architecture capable of performing material implication. As an application example, an IMP-based implementation of a full-adder is presented. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:191 / 197
页数:7
相关论文
共 20 条
[1]   GIANT MAGNETORESISTANCE OF (001)FE/(001) CR MAGNETIC SUPERLATTICES [J].
BAIBICH, MN ;
BROTO, JM ;
FERT, A ;
VANDAU, FN ;
PETROFF, F ;
EITENNE, P ;
CREUZET, G ;
FRIEDERICH, A ;
CHAZELAS, J .
PHYSICAL REVIEW LETTERS, 1988, 61 (21) :2472-2475
[2]   Emission of spin waves by a magnetic multilayer traversed by a current [J].
Berger, L .
PHYSICAL REVIEW B, 1996, 54 (13) :9353-9358
[3]  
Bickerstaff K, 2010, CONF REC ASILOMAR C, P1173, DOI 10.1109/ACSSC.2010.5757715
[4]   'Memristive' switches enable 'stateful' logic operations via material implication [J].
Borghetti, Julien ;
Snider, Gregory S. ;
Kuekes, Philip J. ;
Yang, J. Joshua ;
Stewart, Duncan R. ;
Williams, R. Stanley .
NATURE, 2010, 464 (7290) :873-876
[5]   Spin-dependent tunneling conductance of Fe|MgO|Fe sandwiches -: art. no. 054416 [J].
Butler, WH ;
Zhang, XG ;
Schulthess, TC ;
MacLaren, JM .
PHYSICAL REVIEW B, 2001, 63 (05)
[6]   The emergence of spin electronics in data storage [J].
Chappert, Claude ;
Fert, Albert ;
Van Dau, Frederic Nguyen .
NATURE MATERIALS, 2007, 6 (11) :813-823
[7]   A 4-mb toggle MRAM based on a novel bit and switching method [J].
Engel, BN ;
Akerman, J ;
Butcher, B ;
Dave, RW ;
DeHerrera, M ;
Durlam, M ;
Grynkewich, G ;
Janesky, J ;
Pietambaram, SV ;
Rizzo, ND ;
Slaughter, JM ;
Smith, K ;
Sun, JJ ;
Tehrani, S .
IEEE TRANSACTIONS ON MAGNETICS, 2005, 41 (01) :132-136
[8]   A High-Reliability, Low-Power Magnetic Full Adder [J].
Gang, Yi ;
Zhao, Weisheng ;
Klein, Jacques-Olivier ;
Chappert, Claude ;
Mazoyer, Pascale .
IEEE TRANSACTIONS ON MAGNETICS, 2011, 47 (11) :4611-4616
[9]   SPICE Macromodel of Spin-Torque-Transfer-Operated Magnetic Tunnel Junctions [J].
Harms, Jonathan D. ;
Ebrahimi, Farbod ;
Yao, Xiaofeng ;
Wang, Jian-Ping .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (06) :1425-1430
[10]   Thermal activation effect on spin transfer switching in magnetic tunnel junctions [J].
Higo, Y ;
Yamane, K ;
Ohba, K ;
Narisawa, H ;
Bessho, K ;
Hosomi, M ;
Kano, H .
APPLIED PHYSICS LETTERS, 2005, 87 (08)