Electron-impact single and multiple ionization of Mg+ ions

被引：19

作者：

Becker, C ^{[1
]}

Knopp, H ^{[1
]}

Jacobi, J ^{[1
]}

Teng, H ^{[1
]}

Schippers, S ^{[1
]}

Müller, A ^{[1
]}

机构：

[1] Univ Giessen, Inst Kernphys, D-35392 Giessen, Germany

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2004年 / 37卷 / 07期

关键词：

D O I：

10.1088/0953-4075/37/7/011

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Absolute cross sections for single, double and triple electron-impact ionization of Mg+ ions have been measured by employing a crossed-beams experimental set-up. Contributions of indirect resonant processes to the total cross section for single ionization such as resonant-excitation-double-autoionization and resonant-excitation-auto-double-ionization have been observed utilizing a high-resolution energy scan technique with statistical uncertainties as low as 0.04%. The experimental cross sections are compared with results of recent R-matrix calculations showing agreement in the overall features but pronounced differences in the details of indirect ionization contributions. Double ionization was found to be dominated by the direct removal of a 2p-electron with subsequent autoionization. There are also indications of indirect processes in the triple ionization of Mg+ but no clear evidence could be established.

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页码：1503 / 1518

页数：16

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