Dynamic behaviour of SOFC short stacks

被引:26
作者
Molinelli, M
Larrain, D
Autissier, N
Ihringer, R
Sfeir, J
Badel, N
Bucheli, O
Van Herle, J [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Lab Ind Energy Syst LENI, Fac Engn, CH-1015 Lausanne, Switzerland
[2] HTCeramix SA, CH-1400 Yverdon, Switzerland
关键词
solid oxide fuel cells; dynamic behaviour; cathode activation; thermal cycling; degradation;
D O I
10.1016/j.jpowsour.2005.10.040
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electrical output behaviour obtained on solid oxide fuel cell stacks, based on planar anode supported cells (50 or 100 cm(2) active area) and metallic interconnects, is reported. Stacks (1-12 cells) have been operated with cathode air and anode hydrogen flows between 750 and 800 degrees C operating temperature. At first polarisation, an activation phase (increase in power density) is typically observed, ascribed to the cathode but not clarified. Activation may extend over days or weeks. The materials are fairly resistant to thermal cycling. A 1-cell stack cycled five times in 4 days at heating/cooling rates of 100-300 Kh(-1), showed no accelerated degradation. In a 5-cell stack, open circuit voltage (OCV) of all cells remained constant after three full cycles (800-25 degrees C). Power output is little affected by air flow but markedly influenced by small fuel flow variation. Fuel utilisation reached 88% in one 5-cell stack test. Performance homogeneity between cells lay at +/- 4-8% for three different 5- or 6-cell stacks, but was poor for a 12-cell stack with respect to the border cells. Degradation of a 1-cell stack operated for 5500 h showed clear dependence on operating conditions (cell voltage, fuel conversion), believed to be related to anode reoxidation (Ni). A 6-cell stack (50 cm(2) cells) delivering 100W(el) at 790 degrees C (1 kW(el) L(-1) or 0.34 W cm(-2)) went through a fuel supply interruption and a thermal cycle, with one out of the six cells slightly underperforming after these events. This cell was eventually responsible (hot spot) for stack failure. (c) 2005 Published by Elsevier B.V.
引用
收藏
页码:394 / 403
页数:10
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