Atomic level observation of octahedral distortions at the perovskite oxide heterointerface

被引:143
作者
Aso, Ryotaro [1 ]
Kan, Daisuke [1 ]
Shimakawa, Yuichi [1 ,2 ]
Kurata, Hiroki [1 ,2 ]
机构
[1] Kyoto Univ, Inst Chem Res, Kyoto 6110011, Japan
[2] Japan Sci & Technol Agcy, CREST, Kyoto 6110011, Japan
基金
日本科学技术振兴机构;
关键词
FERROELECTRICITY; POLARIZATION; ENHANCEMENT; CRYSTALS;
D O I
10.1038/srep02214
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
For perovskite oxides, ABO(3), slight octahedral distortions have close links to functional properties. While perovskite oxide heterostructures offer a good platform for controlling functionalities, atomistic understanding of octahedral distortion at the interface has been a challenge as it requires precise measurements of the oxygen atomic positions. Here we demonstrate an approach to clarify distortions at an atomic level using annular bright-field imaging in aberration-corrected scanning transmission electron microscopy, which provides precise mappings of cation and oxygen atomic positions from distortion-minimized images. This technique revealed significant distortions of RuO6 and ScO6 octahedra at the heterointerface between a SrRuO3 film and a GdScO3 substrate. We also found that structural mismatch was relieved within only four unit cells near the interface by shifting the oxygen atomic positions to accommodate octahedral tilt angle mismatch. The present results underscore the critical role of the oxygen atom in the octahedral connectivity at the perovskite oxide heterointerface.
引用
收藏
页数:6
相关论文
共 46 条
[1]   Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices [J].
Boris, A. V. ;
Matiks, Y. ;
Benckiser, E. ;
Frano, A. ;
Popovich, P. ;
Hinkov, V. ;
Wochner, P. ;
Castro-Colin, M. ;
Detemple, E. ;
Malik, V. K. ;
Bernhard, C. ;
Prokscha, T. ;
Suter, A. ;
Salman, Z. ;
Morenzoni, E. ;
Cristiani, G. ;
Habermeier, H. -U. ;
Keimer, B. .
SCIENCE, 2011, 332 (6032) :937-940
[2]   Suppression of Octahedral Tilts and Associated Changes in Electronic Properties at Epitaxial Oxide Heterostructure Interfaces [J].
Borisevich, A. Y. ;
Chang, H. J. ;
Huijben, M. ;
Oxley, M. P. ;
Okamoto, S. ;
Niranjan, M. K. ;
Burton, J. D. ;
Tsymbal, E. Y. ;
Chu, Y. H. ;
Yu, P. ;
Ramesh, R. ;
Kalinin, S. V. ;
Pennycook, S. J. .
PHYSICAL REVIEW LETTERS, 2010, 105 (08)
[3]   Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape Analysis [J].
Borisevich, AlbinaY. ;
Ovchinnikov, Oleg S. ;
Chang, Hye Jung ;
Oxley, Mark P. ;
Yu, Pu ;
Seidel, Jan ;
Eliseev, Eugine A. ;
Morozovska, Anna N. ;
Ramesh, Ramamoorthy ;
Pennycook, Stephen J. ;
Kalinin, Sergei V. .
ACS NANO, 2010, 4 (10) :6071-6079
[4]   Improper ferroelectricity in perovskite oxide artificial superlattices [J].
Bousquet, Eric ;
Dawber, Matthew ;
Stucki, Nicolas ;
Lichtensteiger, Celine ;
Hermet, Patrick ;
Gariglio, Stefano ;
Triscone, Jean-Marc ;
Ghosez, Philippe .
NATURE, 2008, 452 (7188) :732-U4
[5]   Thickness-dependent structural phase transition of strained SrRuO3 ultrathin films: The role of octahedral tilt [J].
Chang, Seo Hyoung ;
Chang, Young Jun ;
Jang, S. Y. ;
Jeong, D. W. ;
Jung, C. U. ;
Kim, Y. -J. ;
Chung, J. -S. ;
Noh, T. W. .
PHYSICAL REVIEW B, 2011, 84 (10)
[6]   Enhancement of ferroelectricity in strained BaTiO3 thin films [J].
Choi, KJ ;
Biegalski, M ;
Li, YL ;
Sharan, A ;
Schubert, J ;
Uecker, R ;
Reiche, P ;
Chen, YB ;
Pan, XQ ;
Gopalan, V ;
Chen, LQ ;
Schlom, DG ;
Eom, CB .
SCIENCE, 2004, 306 (5698) :1005-1009
[7]   Optimized Ar+-ion milling procedure for TEM cross-section sample preparation [J].
Dieterle, Levin ;
Butz, Benjamin ;
Mueller, Erich .
ULTRAMICROSCOPY, 2011, 111 (11) :1636-1644
[8]   Dynamics of annular bright field imaging in scanning transmission electron microscopy [J].
Findlay, S. D. ;
Shibata, N. ;
Sawada, H. ;
Okunishi, E. ;
Kondo, Y. ;
Ikuhara, Y. .
ULTRAMICROSCOPY, 2010, 110 (07) :903-923
[9]   Robust atomic resolution imaging of light elements using scanning transmission electron microscopy [J].
Findlay, S. D. ;
Shibata, N. ;
Sawada, H. ;
Okunishi, E. ;
Kondo, Y. ;
Yamamoto, T. ;
Ikuhara, Y. .
APPLIED PHYSICS LETTERS, 2009, 95 (19)
[10]  
Galindo P., 2009, MICROSC ANAL, V23, P23