Edge Intelligence-On the Challenging Road to a Trillion Smart Connected IoT Devices Moving Artificial Intelligence from the Cloud Down to the Edge

被引：52
作者：
Keshavarzi, Ali [1 ,2 ]
van den Hoek, Wilbert [2 ]
机构：
[1] Stanford Univ, Stanford, CA 94305 USA
[2] Leading Edge Res, Los Altos, CA USA
来源：
IEEE DESIGN & TEST | 2019年 / 36卷 / 02期
关键词：
Edge intelligence - Purdue University;
D O I：
10.1109/MDAT.2019.2899075
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Editor's note: This article provides an industry and government perspective to the problem of intelligence resource constrained IoT nodes and presents the vision of the future and important technologies that might play a strong role in enabling the vision of trillion smart connected sensors.-Shreyas Sen, Purdue University. © 2013 IEEE.
引用
收藏
页码：41 / 64
页数：24
相关论文
共 50 条
[31]  
Muller J, 2013, TECH DIG, P280, DOI [10.1109/IEDM.2013.6724605, DOI 10.1109/IEDM.2013.6724605, 10.1109/iedm.2013.6724605]
[32]  
Ni K., 2018, IEDM, DOI DOI 10.1109/IEDM.2018.8614496
[33]  
Paul S, 2016, SYMP VLSI CIRCUITS
[34]  
Peng V., 2018, HOT CHIPS 2018
[35]  
Pister K., SMART DUST
[36]  
Raychowdhury Arijit, 2017, STANFORD TALK
[37]  
Rekhi A. S., 2018, INT SOL STAT CIRC C
[38]  
Rhines W., 2018, DARPA ERI SUMMIT 201
[39]  
Rogers B., 2013, IWLPC
[40]   Use of negative capacitance to provide voltage amplification for low power nanoscale devices [J].
Salahuddin, Sayeef ;
Dattat, Supriyo .
NANO LETTERS, 2008, 8 (02) :405-410
12345