a-Si robust gate driver for 7.0-in. WVGA LCD panel

被引：10

作者：

Chen, Hung-Chun ^{[1
]}

Chiang, Ko-Yu ^{[1
]}

Chen, Ming-Daw ^{[1
]}

Kung, Chen-Pang ^{[1
]}

Hou, Wei-Hsin ^{[1
]}

机构：

[1] Ind Technol Res Inst, Elect & Optoelect Res Labs, Flexible Elect Technol Div, Hsinchu, Taiwan

来源：

2007 SID INTERNATIONAL SYMPOSIUM, DIGEST OF TECHNICAL PAPERS, VOL XXXVIII, BOOKS I AND II | 2007年 / 38卷

关键词：

D O I：

10.1889/1.2785269

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We proposed an Hydrogenated amorphous silicon thin Film transistors (a-Si:H TFT) robust gate driver on glass substrate for the 7-inch WVGA TFT-LCD panel. By utilizing the specific design technique, the threshold voltage (V-th) shift of the a-si TFT in the gate driver can be compensated. Under reliability simulations, the gate driver can operates correctly over 8 days in 80 degrees C, although the V-th increased to ten times of the initial value. The integrated a-Si TFT gate driver can effectively reduce the cost of TFT-LCD manufacturing in the future.

引用

页码：222 / 225

页数：4

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