Creating High-Stability High-Precision Bipolar Trim Power Supply

被引:0
|
作者
Chen, Z. [1 ]
Merz, W. [1 ]
机构
[1] Thomas Jefferson Natl Accelerator Facil, Newport News, VA 23602 USA
来源
2012 IEEE POWER ENGINEERING SOCIETY CONFERENCE AND EXPOSITION IN AFRICA (POWERAFRICA) | 2012年
关键词
trim power supply; integrated circuit; feedback control; temperature test;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thomas Jefferson National Accelerator Facility (TJNAF) is founded by the US Department of Energy (DOE) office of science for the technology advancement and physics research in electron beam accelerator. This facility has the state of the art technology to carry out world-class cutting-edge experiments for the nucleus composition and atomic characteristics identification and exploration for the nature of the matter in the universe. A continuous wave electron beam is featured for such experiments, thus precise and stable trim power supply is required to meet such purpose. This paper demonstrates the challenges and solutions to design, assemble, fabrication and test such high-precision high-stability power supplies. This paper presents the novel design and first article test of the +/-20A +/-75V bipolar, 100ppm stability level current-regulated high-power trim power supplies for the beam manipulation. This special design can provide valuable documentation and reference values for future designs and special applications in particle accelerator power supply creation.
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页数:5
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