Fabrication Methodology of Enhanced Stability Room Temperature TlBr Gamma Detectors

被引:21
作者
Conway, Adam M. [1 ]
Voss, Lars F. [1 ]
Nelson, Art J. [1 ]
Beck, Patrick R. [1 ]
Laurence, Ted A. [1 ]
Graff, Robert T. [1 ]
Nikolic, Rebecca J. [1 ]
Payne, Stephen A. [1 ]
Kim, Hadong [2 ]
Cirignano, Leonard. J. [2 ]
Shah, Kanai [2 ]
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Radiation Monitoring Devices Inc, Watertown, MA 02472 USA
关键词
Room temperature gamma detector; semiconductor radiation detector; thallium bromide (TlBr); CRYSTALS;
D O I
10.1109/TNS.2013.2252363
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thallium bromide (TlBr) is a material of interest for use in room temperature gamma ray detector applications due to is wide bandgap 2.7 eV and high average atomic number (Tl81, Br 35). Researchers have achieved energy resolutions of 1.3% at 662 keV, demonstrating the potential of this material system. However, these detectors are known to polarize using conventional configurations, limiting their use. While high quality material is a critical starting point for excellent detector performance, we show that the room temperature stability of planar TlBr gamma spectrometers can be significantly enhanced by treatment with both hydrofluoric and hydrochloric acid. By incorporating F or Cl into the surface of TlBr, current instabilities are eliminated and the longer term current of the detectors remains unchanged. In addition the choice of electrode metal is shown to have a dramatic effect on the long term stability of TlBr detector performance Am-241 spectra are also shown to be more stable for extended periods; detectors have been held at 4000 V/cm for 50 days with less than 10% degradation in peak centroid position.
引用
收藏
页码:1231 / 1236
页数:6
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