Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction

被引：6

作者：

Sun Yun ^{[1
]}

Wang Sheng-Lai ^{[1
]}

Gu Qing-Tian ^{[1
]}

Xu Xin-Guang ^{[1
]}

Ding Jian-Xu ^{[1
]}

Liu Wen-Jie ^{[1
]}

Liu Guang-Xia ^{[1
]}

Zhu Sheng-Jun ^{[1
]}

机构：

[1] Shandong Univ, China State Key Lab Crystal Mat, Jinan 250100, Peoples R China

来源：

ACTA PHYSICA SINICA | 2012年 / 61卷 / 21期

基金：

中国国家自然科学基金;

关键词：

high resolution X-ray diffraction; lattice strain; stress; crack;

D O I：

10.7498/aps.61.210203

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The lattice strain of large-scale KDP crystal is characterized by using high resolution X-ray diffraction technique, and the lattice stress is analysed quantitatively in detail. The results indicate that KDP crystal may cleave easily along the [001] direction, which corresponds to the cracking phenomenon in the practical work. The major factors of introducing the internal stress and causing crack in the crystal growth process are summarized. Those conclusions provide important theoretical basis for proposing crack control measures of the large-scale KDP crystals.

引用

页数：6

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