共 29 条
Elucidation of ambient gas effects in organic nano-floating-gate nonvolatile memory
被引:14
作者:

She, Xiao-Jian
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机构:
Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China

Liu, Chang-Hai
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Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China

Zhang, Jing-Yu
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Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China

Gao, Xu
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Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China

Wang, Sui-Dong
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Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China
机构:
[1] Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Suzhou 215123, Jiangsu, Peoples R China
基金:
中国国家自然科学基金;
关键词:
FIELD-EFFECT TRANSISTORS;
PENTACENE;
STABILITY;
D O I:
10.1063/1.4790186
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Pentacene-based organic field-effect transistor nonvolatile memories employing nano-floating-gate show high performance in vacuum, typically with field-effect mobility of 0.6 cm(2)/Vs, memory window of 45 V, reading ON/OFF ratio over 10(6), and excellent retention ability and programming/erasing endurance. The memory performance is unstable in air, which is demonstrated to result mainly from the device operation instability in O-2. The O-2-induced acceptor-like trap states reduce the electron supply in pentacene during programming, limiting the electron trapping into the nano-floating-gate and thus suppressing the positive threshold voltage shift. The corresponding hole trapping during erasing is not effectively influenced by the ambient gas effects. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4790186]
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