A survey of acceptor dopants for β-Ga2O3

被引:174
作者
Lyons, John L. [1 ]
机构
[1] US Naval Res Lab, Ctr Computat Mat Sci, Washington, DC 20375 USA
关键词
acceptor impurities; doping; first-principles calculations; gallium oxide; N-DOPED BETA-GA2O3; ELECTRONIC-STRUCTURE; OPTICAL-PROPERTIES;
D O I
10.1088/1361-6641/aaba98
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With a wide band gap, high critical breakdown voltage and commercially available substrates, Ga2O3 is a promising material for next-generation power electronics. Like most wide-band-gap semiconductors, obtaining better control over its electrical conductivity is critically important, but has proven difficult to achieve. Although efficient p-type doping in Ga2O3 is not expected, since theory and experiment indicate the self-trapping of holes, the full development of this material will require a better understanding of acceptor dopants. Here the properties of group 2, group 5 and group 12 acceptor impurities in beta-Ga2O3 are explored using hybrid density functional calculations. All impurities are found to exhibit acceptor transition levels above 1.3 eV. After examining formation energies as a function of chemical potential, Mg (followed closely by Be) is determined to be the most stable acceptor species.
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页数:5
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  • [1] Solar blind photodetector based on epitaxial zinc doped Ga2O3 thin film
    Alema, Fikadu
    Hertog, Brian
    Ledyaev, Oleg
    Volovik, Dmitry
    Thoma, Grant
    Miller, Ross
    Osinsky, Andrei
    Mukhopadhyay, Partha
    Bakhshi, Sara
    Ali, Haider
    Schoenfeld, Winston V.
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2017, 214 (05):
  • [2] IMPROVED TETRAHEDRON METHOD FOR BRILLOUIN-ZONE INTEGRATIONS
    BLOCHL, PE
    JEPSEN, O
    ANDERSEN, OK
    [J]. PHYSICAL REVIEW B, 1994, 49 (23): : 16223 - 16233
  • [3] A hybrid density functional study of lithium in ZnO: Stability, ionization levels, and diffusion
    Carvalho, A.
    Alkauskas, A.
    Pasquarello, Alfredo
    Tagantsev, A. K.
    Setter, N.
    [J]. PHYSICAL REVIEW B, 2009, 80 (19)
  • [4] Recessed-Gate Enhancement-Mode β-Ga2O3 MOSFETs
    Chabak, Kelson D.
    McCandless, Jonathan P.
    Moser, Neil A.
    Green, Andrew J.
    Mahalingam, Krishnamurthy
    Crespo, Antonio
    Hendricks, Nolan
    Howe, Brandon M.
    Tetlak, Stephen E.
    Leedy, Kevin
    Fitch, Robert C.
    Wakimoto, Daiki
    Sasaki, Kohei
    Kuramata, Akito
    Jessen, Gregg H.
    [J]. IEEE ELECTRON DEVICE LETTERS, 2018, 39 (01) : 67 - 70
  • [5] P-type β-gallium oxide: A new perspective for power and optoelectronic devices
    Chikoidze, Ekaterine
    Fellous, Adel
    Perez-Tomas, Amador
    Sauthier, Guillaume
    Tchelidze, Tamar
    Cuong Ton-That
    Tung Thanh Huynh
    Phillips, Matthew
    Russell, Stephen
    Jennings, Mike
    Berini, Bruno
    Jomard, Francois
    Dumont, Yves
    [J]. MATERIALS TODAY PHYSICS, 2017, 3 : 118 - 126
  • [6] Ab initio study of N-doped β-Ga2O3 with intrinsic defects: the structural, electronic and optical properties
    Dong, Linpeng
    Jia, Renxu
    Li, Chong
    Xin, Bin
    Zhang, Yuming
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 712 : 379 - 385
  • [7] First-principles calculations for point defects in solids
    Freysoldt, Christoph
    Grabowski, Blazej
    Hickel, Tilmann
    Neugebauer, Joerg
    Kresse, Georg
    Janotti, Anderson
    Van de Walle, Chris G.
    [J]. REVIEWS OF MODERN PHYSICS, 2014, 86 (01) : 253 - 305
  • [8] Electrostatic interactions between charged defects in supercells
    Freysoldt, Christoph
    Neugebauer, Joerg
    Van de Walle, Chris G.
    [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2011, 248 (05): : 1067 - 1076
  • [9] Fully Ab Initio Finite-Size Corrections for Charged-Defect Supercell Calculations
    Freysoldt, Christoph
    Neugebauer, Joerg
    Van de Walle, Chris G.
    [J]. PHYSICAL REVIEW LETTERS, 2009, 102 (01)
  • [10] ULTRAVIOLET LUMINESCENCE OF BETA-GALLIUMSESQUIOXIDE
    HARWIG, T
    KELLENDONK, F
    SLAPPENDEL, S
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1978, 39 (06) : 675 - 680