Exploring electronic structure of one-atom thick polycrystalline graphene films: A nano angle resolved photoemission study

被引:78
作者
Avila, Jose [1 ]
Razado, Ivy [1 ]
Lorcy, Stephane
Fleurier, Romain [2 ]
Pichonat, Emmanuelle [2 ]
Vignaud, Dominique [2 ]
Wallart, Xavier [2 ]
Asensio, Maria C. [1 ]
机构
[1] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France
[2] IEMN, UMR CNRS 8520, F-59652 Villeneuve Dascq, France
关键词
SUBSTRATE;
D O I
10.1038/srep02439
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The ability to produce large, continuous and defect free films of graphene is presently a major challenge for multiple applications. Even though the scalability of graphene films is closely associated to a manifest polycrystalline character, only a few numbers of experiments have explored so far the electronic structure down to single graphene grains. Here we report a high resolution angle and lateral resolved photoelectron spectroscopy (nano-ARPES) study of one-atom thick graphene films on thin copper foils synthesized by chemical vapor deposition. Our results show the robustness of the Dirac relativistic-like electronic spectrum as a function of the size, shape and orientation of the single-crystal pristine grains in the graphene films investigated. Moreover, by mapping grain by grain the electronic dynamics of this unique Dirac system, we show that the single-grain gap-size is 80% smaller than the multi-grain gap recently reported by classical ARPES.
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页数:8
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