Optics of nano-objects

被引:1
|
作者
Tomanek, Pavel [1 ]
Grmela, Lubomir [1 ]
机构
[1] Brno Univ Technol, Fac Elect Engn & Commun, Dept Phys, Brno 61600, Czech Republic
关键词
nanoobject; visualization; far-field; near-field; scanning near field optical microscopy; contrast; detection; localization; resolution; measurement;
D O I
10.1117/12.797344
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Conventional optics is diffraction limited to about half of the effective optical wavelength. However the current trend towards miniaturization of optical elements and devices requires methods of observation with high spatial resolutions adapted to the micrometer and submicrometer optical regime. More specifically, the use of Scanning near-field optical microscope (SNOM or NSOM) in various domains is overviewed. Basically an optical tip with a subwavelength aperture at its apex scans over a surface with a spatial resolution, which is not limited by light diffraction. This characteristic makes SNOM a valuable tool to perform various optical or spectroscopic studies on nanoobjects, such as semiconductor quantum dots (QDs), or to address them optically. The paper reviews different methods of far-field and near-field approach to visualize nano-size objects.
引用
收藏
页数:11
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