Effects of Interface Roughness and Lattice Strain on Perpendicular Magnetic Anisotropy in Co/Pd Multilayer

被引:6
作者
Go, Naoto [1 ]
Suzuki, Kosuke [1 ]
Emoto, Shun [1 ]
Itou, Masayoshi [2 ]
Sakurai, Yoshiharu [2 ]
Sakurai, Hiroshi [1 ]
机构
[1] Gunma Univ, Grad Sch Engn, Dept Prod Sci & Technol, 29-1 Hon Cho, Ota 3730057, Japan
[2] Japan Synchrotron Radiat Res Inst JASRI, SPring 8, Sayo, Hyogo 6795198, Japan
来源
ADVANCED MICRO-DEVICE ENGINEERING III | 2013年 / 534卷
关键词
Co/Pd multilayers; perpendicular magnetic anisotropy; DV-X alpha calculation; occupation number; lattice strain; interface roughness; PD/CO METALLIC MULTILAYERS; FILM LAYERED STRUCTURES; DICHROISM;
D O I
10.4028/www.scientific.net/KEM.534.7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effects of strain and interface roughness at the Co/Pd interface are investigated from the viewpoint of perpendicular magnetic anisotropy (PMA) using the DV-X alpha cluster model calculation method. It is found that spin projected occupation number ratio of magnetic quantum number vertical bar m vertical bar = 2 for the Co 3d electrons enhances by expanding the lattice within a close-packed plane of fcc stacking and, hence, enhances the PMA. Rough interface decreases the spin projected occupation number ratio of vertical bar m vertical bar = 2 and, hence, decreases the PMA. These results explain the PMA properties of Co/Pd multilayers fabricated using molecular beam epitaxy (MBE) technique and RF sputtering techniques.
引用
收藏
页码:7 / +
页数:3
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