Design of Novel Testable and Diagnosable Phase-Frequency Detector

被引:2
作者
Gholami, Mohammad [1 ]
Baleghi, Yasser [1 ]
Ardeshir, Gholamreza [1 ]
机构
[1] Babol Noshirvani Univ Technol, Dept Elect Engn, Babol Sar, Iran
关键词
Phase-Frequency Detector; PFD; DLL; PLL; Testable; Diagnosable; DLL; ARCHITECTURE; JITTER;
D O I
10.1007/s00034-013-9679-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a novel fully testable and diagnosable structure for phase-frequency detectors. All procedures of converting the conventional PFD to the fully testable one are reported step by step. Also, the probability-based testability of proposed architecture is calculated. In addition, area considerations related to new fully testable PFD are introduced completely. At last, the proposed structure is designed in both system level and circuit level. The results of fully testable PFD in 0.13-mu m CMOS technology are shown. Simulation results confirm the theoretical analysis.
引用
收藏
页码:999 / 1018
页数:20
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