Light-induced refractive-index modifications in dielectric thin films: Experimental determination of relaxation time and amplitude

被引：7
作者：
Monneret, S
Tisserand, S
Flory, F
Rigneault, H
机构：
[1] Laboratoire d’Optique des Surfaces et des Couches Minces, Unité Associée au Centre National de la Recherche Scientifique, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de St. Jéräme, Marseille, 13397
来源：
APPLIED OPTICS | 1996年 / 35卷 / 25期
关键词：
thermal effects; thin films; prism coupling; guided waves;
D O I：
10.1364/AO.35.005013
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A two-beam setup based on the totally reflecting prism coupler is shown to be a powerful means of characterizing light-induced refractive-index modifications in dielectric thin films. Rise and relaxation times and amplitudes of thin-film refractive-index variations can be measured. Some developments of the electromagnetic theory of prism coupling are presented for Gaussian incident beams. Measurements made on a single Ta2O5 layer deposited on a silica glass are presented. Relaxation times of a few milliseconds reveal the thermal origin of the phenomena. The thermal nonlinear coefficient of this Ta2O5 layer is nearly 10(-15) m(2)/W. (C) 1996 Optical Society of America
引用
收藏
页码：5013 / 5020
页数：8
相关论文
共 18 条
[1]   NONLINEAR COUPLING IN A PLANAR WAVE-GUIDE [J].
BERTOLOTTI, M ;
FAZIO, E ;
FERRARI, A ;
MICHELOTTI, F ;
RIGHINI, GC ;
SIBILIA, C .
OPTICS LETTERS, 1990, 15 (08) :425-427
[2]   PHOTOTHERMAL DEFLECTION TECHNIQUE FOR MEASURING THERMAL NONLINEARITIES IN SEMICONDUCTOR GLASSES [J].
BERTOLOTTI, M ;
FERRARI, A ;
SIBILIA, C ;
SUBER, G ;
APOSTOL, D ;
JANI, P .
APPLIED OPTICS, 1988, 27 (09) :1811-1813
[3]   THIN-FILMS FIELD-TRANSFER MATRIX-THEORY OF PLANAR MULTILAYER WAVEGUIDES AND REFLECTION FROM PRISM-LOADED WAVEGUIDES [J].
CHILWELL, J ;
HODGKINSON, I .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1984, 1 (07) :742-753
[4]   PRISM COUPLER JIG - INTERFERENCE-FRINGES ENABLE OBSERVATION OF THE COUPLING GAP [J].
CHILWELL, JT .
APPLIED OPTICS, 1982, 21 (07) :1310-1319
[5]  
COMMANDRE M, 1995, THIN FILMS OPTICAL S, V49, P329
[6]  
COMMANDRE M, 1995, COMMUNICATION
[7]   INFRARED PRISM COUPLING CHARACTERIZATION AND OPTIMIZATION VIA NEAR-FIELD M-LINE SCANNING [J].
FALCO, C ;
AZEMA, A ;
BOTINEAU, J ;
OSTROWSKY, DB .
APPLIED OPTICS, 1982, 21 (10) :1847-1850
[8]   CHARACTERIZATION BY GUIDED-WAVE OF INSTABILITIES OF OPTICAL COATINGS SUBMITTED TO HIGH-POWER FLUX - THERMAL AND 3RD-ORDER NONLINEAR PROPERTIES OF DIELECTRIC THIN-FILMS [J].
FLORY, F ;
RIGNEAULT, H ;
MAYTHAVEEKULCHAI, N ;
ZAMKOTSIAN, F .
APPLIED OPTICS, 1993, 32 (28) :5628-5639
[9]   OPTICAL BISTABILITY BY PHOTOTHERMAL DISPLACEMENT IN PRISM COUPLING INTO PLANAR WAVE-GUIDES [J].
LUKOSZ, W ;
PIRANI, P ;
BRIGUET, V .
OPTICS LETTERS, 1987, 12 (04) :263-265
[10]  
MACLEOD HA, 1986, THIN FILM OPTICAL FI, P11
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