Thermal stress induced by electric current in the vicinity of an elliptic inclusion in an infinite plate

被引:6
作者
Song, K. [1 ,2 ]
Song, H. P. [1 ]
Schiavone, P. [2 ]
Gao, C. F. [1 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, State Key Lab Mech & Control Mech Struct, Nanjing 210016, Jiangsu, Peoples R China
[2] Univ Alberta, Dept Mech Engn, Edmonton, AB T6G 1H9, Canada
基金
中国国家自然科学基金; 加拿大自然科学与工程研究理事会;
关键词
Electric current; elliptic inclusion; thermal stress; TEMPERATURE; NANOSHEETS; STABILITY; CRACK;
D O I
10.1080/01495739.2019.1607789
中图分类号
O414.1 [热力学];
学科分类号
摘要
We consider an elliptic inclusion embedded in an infinite plate subjected to the simultaneous effects of electric current and energy flux at infinity. Using complex variable methods, we analyze the resulting mechanical properties of the composite, in particular around the perimeter of the inclusion. In doing so, we find that thermal stress can exist even in a simply connected region as a result of Joule heating which can therefore be used to preset stress in manufactured devices. In the particular case of the elliptic inclusion, we find that the electric current has the ability to transfer thermal stress to regions of lower temperature thereby improving security and reliability of the corresponding devices.
引用
收藏
页码:976 / 992
页数:17
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