SHG/2PF microscopy of single and multi-layer graphene

被引：2

作者：

Klekachev, Alexander V. ^{[1
]}

Asselberghs, Inge ^{[1
]}

Huyghebaert, Cedric ^{[1
]}

Vanbel, Maarten

Van der Veen, Monique A.

Stesmans, Andre L.

Heyns, Marc M. ^{[1
]}

De Gendt, Stefan ^{[1
]}

Verbiest, Thierry

机构：

[1] IMEC, B-3001 Louvain, Belgium

来源：

OPTICAL PROCESSES IN ORGANIC MATERIALS AND NANOSTRUCTURES | 2012年 / 8474卷

关键词：

graphene; second-harmonic generation; multi-photon fluorescence; imaging; 2ND-HARMONIC GENERATION MICROSCOPY; GROUP SYMMETRY DETERMINATION; ENERGY;

D O I：

10.1117/12.929992

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Since the discovery of graphene in 2004 by Novoselov and Geim, a lot of research emphasis has been directed towards its characterization. Most of the important scientific breakthroughs have been obtained on exfoliated graphene (produced via the well known 'scotch tape' method), nowadays, different synthetic routes have been developed to obtain large-scale graphene. Among several optical techniques, Raman spectroscopy is the one most often employed to characterize the defects, number of graphene layers and other properties of the graphitic films regardless of their fabrication method. In this work, we will report on the microscopic imaging of the two-photon fluorescence (2PF) properties and the second-harmonic generation (SHG) in both single layer and few layer graphene.

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页数：8

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