Micrometer-scale fabrication of complex three dimensional lattice plus basis structures in silicon

被引:27
作者
Burckel, D. Bruce [1 ]
Resnick, Paul J. [1 ]
Finnegan, Patrick S. [1 ]
Sinclair, Michael B. [1 ]
Davids, Paul S. [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
MEMBRANE PROJECTION LITHOGRAPHY; PHOTONIC METAMATERIALS; CRYSTALS; BANDGAP; INDEX;
D O I
10.1364/OME.5.002231
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A complementary metal oxide semiconductor (CMOS) compatible version of membrane projection lithography (MPL) for fabrication of micrometer-scale three-dimensional structures is presented. The approach uses all inorganic materials and standard CMOS processing equipment. In a single layer, MPL is capable of creating all 5 2D-Bravais lattices. Furthermore, standard semiconductor processing steps can be used in a layer-by-layer approach to create fully three dimensional structures with any of the 14 3D-Bravais lattices. The unit cell basis is determined by the projection of the membrane pattern, with many degrees of freedom for defining functional inclusions. Here we demonstrate several unique structural motifs, and characterize 2D arrays of unit cells with split ring resonators in a silicon matrix. The structures exhibit strong polarization dependent resonances and, for properly oriented split ring resonators (SRRs), coupling to the magnetic field of a normally incident transverse electromagnetic wave, a response unique to 3D inclusions. (C) 2015 Optical Society of America
引用
收藏
页码:2231 / 2239
页数:9
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