NANOSCALE MAGNETOMETRY Microscopy with single spins

被引:48
作者
Degen, Christian [1 ]
机构
[1] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA
关键词
D O I
10.1038/nnano.2008.328
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Two teams of researchers have exploited defects in diamond to demonstrate a new approach to magnetic sensing and imaging at the nanoscale.
引用
收藏
页码:643 / 644
页数:2
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