Conductive-AFM Patterning of Organic Semiconductors

被引：12

作者：

Brown, Benjamin P. ^{[1
,2
]}

Picco, Loren ^{[3
,4
]}

Miles, Mervyn J. ^{[3
,4
]}

Faul, Charl F. J. ^{[1
]}

机构：

[1] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England

[2] Univ Bristol, Bristol Ctr Funct Nanomat, Ctr Nanosci & Quantum Informat, Bristol BS8 1FD, Avon, England

[3] Univ Bristol, Sch Phys, Bristol BS8 1TL, Avon, England

[4] Univ Bristol, Ctr Nanosci & Quantum Informat, Bristol BS8 1FD, Avon, England

来源：

SMALL | 2015年 / 11卷 / 38期

基金：

英国工程与自然科学研究理事会;

关键词：

ATOMIC-FORCE MICROSCOPY; SCANNING PROBE LITHOGRAPHY; MONOLAYERS; OXIDATION; NANOLITHOGRAPHY; OLIGO(ANILINE)S; OPPORTUNITIES; POLYANILINE; CHEMISTRY;

D O I：

10.1002/smll.201501779

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage. © 2015 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：5054 / 5058

页数：5

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