Breaking the diffraction limit using entanglement based microscopy

被引:0
作者
Schlenk, Daniel [1 ]
Weinfurter, Harald [1 ]
机构
[1] Univ Munich, Fak Phys, D-80799 Munich, Germany
来源
QUANTUM COMMUNICATIONS AND QUANTUM IMAGING XI | 2013年 / 8875卷
关键词
microscopy; entanglement; FLUORESCENCE MICROSCOPY; INTERFERENCE;
D O I
10.1117/12.2023010
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The resolution of optical scanning microscopes is limited by the spot size of the scanning beam. It has been proposed by Boto(1) et al. and Nasr(2) et al. that momentum entangled photons can be focused more tightly than classical light. Thus they should enable one to break the diffractive resolution limit. We report experiments measuring the spatial distribution of strong focussed momentum entangled photon pairs at a center wavelength of 812 nm from a spontaneous parametric down conversion source. Using a single gold stripe deposited on a glass surface as test object we observe a two-photon spot size as small as 194 nm, thereby beating the diffraction limit even for conventional two-photon microscopy.
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页数:7
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共 13 条
  • [1] Quantum interferometric optical lithography: Exploiting entanglement to beat the diffraction limit
    Boto, AN
    Kok, P
    Abrams, DS
    Braunstein, SL
    Williams, CP
    Dowling, JP
    [J]. PHYSICAL REVIEW LETTERS, 2000, 85 (13) : 2733 - 2736
  • [2] da Costa Moura A. G., 2008, ARXIV08064624
  • [3] 2-PHOTON LASER SCANNING FLUORESCENCE MICROSCOPY
    DENK, W
    STRICKLER, JH
    WEBB, WW
    [J]. SCIENCE, 1990, 248 (4951) : 73 - 76
  • [4] Goodman J.W., 1996, OPT ENG, V35, P1513, DOI DOI 10.1117/1.601121
  • [5] BREAKING THE DIFFRACTION RESOLUTION LIMIT BY STIMULATED-EMISSION - STIMULATED-EMISSION-DEPLETION FLUORESCENCE MICROSCOPY
    HELL, SW
    WICHMANN, J
    [J]. OPTICS LETTERS, 1994, 19 (11) : 780 - 782
  • [6] THEORY OF PARAMETRIC FREQUENCY DOWN CONVERSION OF LIGHT
    HONG, CK
    MANDEL, L
    [J]. PHYSICAL REVIEW A, 1985, 31 (04): : 2409 - 2418
  • [7] Biphoton focusing for two-photon excitation
    Nasr, MB
    Abouraddy, AF
    Booth, MC
    Saleh, BEA
    Sergienko, AV
    Teich, MC
    Kempe, M
    Wolleschensky, R
    [J]. PHYSICAL REVIEW A, 2002, 65 (02): : 1 - 6
  • [8] EXPERIMENT ON NONCLASSICAL 4TH-ORDER INTERFERENCE
    OU, ZY
    ZOU, XY
    WANG, LJ
    MANDEL, L
    [J]. PHYSICAL REVIEW A, 1990, 42 (05): : 2957 - 2965
  • [9] 2-PHOTON INTERFERENCE IN A MACH-ZEHNDER INTERFEROMETER
    RARITY, JG
    TAPSTER, PR
    JAKEMAN, E
    LARCHUK, T
    CAMPOS, RA
    TEICH, MC
    SALEH, BEA
    [J]. PHYSICAL REVIEW LETTERS, 1990, 65 (11) : 1348 - 1351
  • [10] CONTROLLING THE DEGREE OF VISIBILITY OF YOUNGS FRINGES WITH PHOTON COINCIDENCE MEASUREMENTS
    RIBEIRO, PHS
    PADUA, S
    DASILVA, JCM
    BARBOSA, GA
    [J]. PHYSICAL REVIEW A, 1994, 49 (05): : 4176 - 4179