Imaging subwavelength holes in chromium films in scanning near-field optical microscopy.: Comparison between experiments and calculation

被引：9
作者：
Ducourtieux, S
Grésillon, S
Rivoal, JC
Vannier, C
Bainier, C
Courjon, D
Cory, H
机构：
[1] Univ Paris 06, ESPCI, Lab Opt Phys, F-75231 Paris 05, France
[2] Univ Franche Comte, Lab Opt PM Duffieux, CNRS, UMR 6603, F-25030 Besancon, France
[3] Technion Israel Inst Technol, Dept Elect Engn, IL-32000 Haifa, Israel
[4] CNRS, UPR 5, F-75231 Paris 05, France
来源：
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2004年 / 26卷 / 01期
关键词：
D O I：
10.1051/epjap:2004014
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Near-field optical signals are imaged in the vicinity of nano-holes using two different near-field optical microscopes. The experimental results are compared with electromagnetic field calculations based on a modal approximation. It turns out that an optical fibre detects the Poynting vector whereas the apertureless tip is sensitive to the field amplitude.
引用
收藏
页码：35 / 43
页数：9
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