Surface x-ray diffraction analysis of the MgO/Fe(001) interface: Evidence for an FeO layer

被引:94
作者
Meyerheim, HL
Popescu, R
Jedrecy, N
Vedpathak, M
Sauvage-Simkin, M
Pinchaux, R
Heinrich, B
Kirschner, J
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany
[2] Ctr Univ Paris Sud, CEA, CNRS, LURE, F-92405 Orsay, France
[3] CNRS, Lab Mineral Cristallog, F-75252 Paris 05, France
[4] Univ Paris 06, F-75252 Paris 05, France
[5] Univ Paris 07, F-75252 Paris 05, France
[6] Simon Fraser Univ, Dept Phys, Burnaby, BC V5A 1S6, Canada
关键词
D O I
10.1103/PhysRevB.65.144433
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using surface x-ray diffraction we have investigated the geometric structure of the interface between thermally grown MgO layers and Fe(001). The MgO/Fe(001) interface is part of the Fe/MgO/Fe junction, which has become a prototype system in the study of the tunneling-magnetoresistance (TMR) effect. For all samples studied in the MgO coverage range between about 0.35 and 4.6 ML we find clear evidence for the presence of a substoichiometric FeO layer between the bulk Fe crystal and the MgO adlayers. The partial oxidation of the Fe(001) surface takes place during deposition of the first MgO monolayer and approaches a concentration limit, where about 60% of the Fe(001) hollow sites are occupied by O ions. The formation of a bulklike sixfold-coordinated Mg coordination at the MgO/O/Fe(001) interface might be accounted for stabilizing the interface structure, in which several Fe-O distances are strained by up to (10% with respect to their bulk analog. The presence of the strained interfacial FeO layer is likely to have considerable consequences on the magnitude of the TMR effect.
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页码:1 / 7
页数:7
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