Atomic force microscopy and near-field optical imaging of a spin transition

被引:13
|
作者
Lopes, Manuel [1 ,2 ]
Quintero, Carlos M. [1 ,2 ]
Hernandez, Edna M. [1 ,2 ]
Velazquez, Victor [3 ]
Bartual-Murgui, Carlos [1 ,2 ]
Nicolazzi, William [1 ,2 ]
Salmon, Lionel [1 ,2 ]
Molnar, Gabor [1 ,2 ]
Bousseksou, Azzedine [1 ,2 ]
机构
[1] CNRS, Chim Coordinat Lab, F-31077 Toulouse, France
[2] Univ Toulouse UPS, INP, F-31077 Toulouse, France
[3] Univ Nacl Autonoma Mexico, Fac Ciencias, Mexico City 04510, DF, Mexico
关键词
CROSSOVER COORDINATION POLYMERS; SINGLE-CRYSTALS; ROOM-TEMPERATURE; FILMS; SPECTROSCOPY; HYSTERESIS; NI; PD;
D O I
10.1039/c3nr03030j
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We report on atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM) investigations of single crystals of the spin crossover complex {Fe(pyrazine)[Pt(CN)(4)]} across the first-order thermal spin transition. We demonstrate for the first time that the change in spin state can be probed with sub-micrometer spatial resolution through various topographic features extracted from AFM data. This original approach based on surface topography analysis should be easy to implement to any phase change material exhibiting sizeable electron-lattice coupling. In addition, AFM images revealed specific topographic features in the crystals, which were correlated with the spatiotemporal evolution of the transition observed by far-field and near-field optical microscopies.
引用
收藏
页码:7762 / 7767
页数:6
相关论文
共 50 条
  • [1] Technique combines atomic force microscopy with near-field optical imaging
    Gaughan, Richard
    PHOTONICS SPECTRA, 2006, 40 (08) : 111 - 112
  • [2] Force imaging of optical near-field using noncontact mode atomic force microscopy
    Abe, M
    Sugawara, Y
    Hara, Y
    Sawada, K
    Morita, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (2A): : L167 - L169
  • [3] Optical processing by scanning near-field optical/atomic force microscopy
    Seiko Instruments Inc, Chiba, Japan
    Thin Solid Films, 1-2 (327-330):
  • [4] Near-Field Acoustic Imaging of Ferroelectrics by Atomic Force Microscopy
    Zeng, Huarong
    Shimamura, Kiyoshi
    Villora, E. A. Garcia
    Kannan, C. Venkadasamy
    Takekawa, Shunji
    Kitamura, Kenji
    Yin, Qingrui
    FERROELECTRICS, 2007, 347 : 120 - 126
  • [5] Optical processing by scanning near-field optical/atomic force microscopy
    Nakajima, K
    Muramastu, H
    Chiba, N
    Ataka, T
    Fujihira, M
    THIN SOLID FILMS, 1996, 273 (1-2) : 327 - 330
  • [6] Simultaneous multicolor fluorescence imaging by scanning near-field optical/atomic force microscopy
    Muramatsu, H
    Kim, JM
    Sugiyama, S
    Ohtani, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (01): : 100 - 103
  • [7] Design and application of scanning near-field optical/atomic force microscopy
    Ataka, T
    Muramatsu, H
    Nakajima, K
    Chiba, N
    Homma, K
    Fujihara, M
    THIN SOLID FILMS, 1996, 273 (1-2) : 154 - 160
  • [8] Metrology in scanning probe microscopy with atomic force microscopy and near-field scanning optical microscopy
    zurMuhlen, E
    Munoz, M
    Gehring, S
    Reineke, F
    EUROPEAN JOURNAL OF CELL BIOLOGY, 1997, 74 : 72 - 72
  • [9] Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy
    Yoshino, T
    Sugiyama, S
    Hagiwara, S
    Fukushi, D
    Shichiri, M
    Nakao, H
    Kim, JM
    Hirose, T
    Muramatsu, H
    Ohtani, T
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 81 - 87
  • [10] Scanning near-field optical/atomic-force microscopy for biomedical applications
    Tamiya, E
    Iwabuchi, S
    Murakami, Y
    Sakaguchi, T
    Yokoyama, K
    Chiba, N
    Muramatsu, H
    CHEMICAL, BIOCHEMICAL, AND ENVIRONMENTAL FIBER SENSORS VIII, 1996, 2836 : 12 - 15