Atomic force microscopy and near-field optical imaging of a spin transition

被引：13
|
作者：
Lopes, Manuel [1 ,2 ]
Quintero, Carlos M. [1 ,2 ]
Hernandez, Edna M. [1 ,2 ]
Velazquez, Victor [3 ]
Bartual-Murgui, Carlos [1 ,2 ]
Nicolazzi, William [1 ,2 ]
Salmon, Lionel [1 ,2 ]
Molnar, Gabor [1 ,2 ]
Bousseksou, Azzedine [1 ,2 ]
机构：
[1] CNRS, Chim Coordinat Lab, F-31077 Toulouse, France
[2] Univ Toulouse UPS, INP, F-31077 Toulouse, France
[3] Univ Nacl Autonoma Mexico, Fac Ciencias, Mexico City 04510, DF, Mexico
来源：
NANOSCALE | 2013年 / 5卷 / 17期
关键词：
CROSSOVER COORDINATION POLYMERS; SINGLE-CRYSTALS; ROOM-TEMPERATURE; FILMS; SPECTROSCOPY; HYSTERESIS; NI; PD;
D O I：
10.1039/c3nr03030j
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
We report on atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM) investigations of single crystals of the spin crossover complex {Fe(pyrazine)[Pt(CN)(4)]} across the first-order thermal spin transition. We demonstrate for the first time that the change in spin state can be probed with sub-micrometer spatial resolution through various topographic features extracted from AFM data. This original approach based on surface topography analysis should be easy to implement to any phase change material exhibiting sizeable electron-lattice coupling. In addition, AFM images revealed specific topographic features in the crystals, which were correlated with the spatiotemporal evolution of the transition observed by far-field and near-field optical microscopies.
引用
收藏
页码：7762 / 7767
页数：6
相关论文
共 50 条
  • [1] Near-Field Hyperspectral Optical Imaging
    Bouillard, Jean-Sebastien G.
    Dickson, Wayne
    Wurtz, Gregory A.
    Zayats, Anatoly V.
    CHEMPHYSCHEM, 2014, 15 (04) : 619 - 629
  • [2] Scanning near-field optical microscopy (SNOM)
    Cricenti, A.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 8, 2008, : 2615 - 2620
  • [3] Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters
    Dryakhlushin, V. F.
    Veiko, V. P.
    Voznesenskii, N. B.
    QUANTUM ELECTRONICS, 2007, 37 (02) : 193 - 203
  • [4] Near-field imaging of optical resonances in silicon metasurfaces using photoelectron microscopy
    Boehm, Alex
    Gennaro, Sylvain D.
    Doiron, Chloe F.
    Beechem, Thomas E.
    Sinclair, Michael B.
    Brener, Igal
    Sarma, Raktim
    Ohta, Taisuke
    APL PHOTONICS, 2024, 9 (06)
  • [5] Near-field optical microscopy in the infrared range
    Piednoir, A
    Creuzet, F
    MICRON, 1996, 27 (05) : 335 - 339
  • [6] Extending the Functions of Scanning Near-field Optical Microscopy
    Horneber, A.
    van den Berg, M.
    Rogalski, J.
    Swider, K.
    Braun, K.
    Meixner, M.
    Meixner, A. J.
    Zhang, D.
    NANOIMAGING AND NANOSPECTROSCOPY II, 2014, 9169
  • [7] Grating enhanced apertureless near-field optical microscopy
    Mihaljevic, Josip
    Hafner, Christian
    Meixner, Alfred J.
    OPTICS EXPRESS, 2015, 23 (14): : 18401 - 18414
  • [8] Enhanced resolution in subsurface near-field optical microscopy
    Krutokhvostov, Roman
    Govyadinov, Alexander A.
    Stiegler, Johannes M.
    Huth, Florian
    Chuvilin, Andrey
    Carney, P. Scott
    Hillenbrand, Rainer
    OPTICS EXPRESS, 2012, 20 (01): : 593 - 600
  • [9] Progress of Scanning Near-Field Optical Microscopy (Invited)
    Chen Yuxin
    Li Zhiyuan
    ACTA OPTICA SINICA, 2024, 44 (10)
  • [10] Near-field optical microscopy in the presence of an intermediate layer
    S. G. Moiseev
    S. V. Sukhov
    Optics and Spectroscopy, 2005, 98 : 308 - 313
12345