Molecular dynamics study of one dimensional nanoscale Si/SiO2 interfaces

被引:1
作者
Carlos Castro-Palacio, Juan [1 ]
Velazquez-Abad, Luisberis [2 ]
Fernandez, Michael [3 ]
Quintin Cuador-Gil, Jose [1 ]
机构
[1] Univ Pinar del Rio, Dept Fis, Pinar Del Rio 20100, Cuba
[2] Univ Catolica Norte, Dept Fis, Antofagasta, Chile
[3] Univ Ottawa, Dept Chem, Ctr Catalysis Res & Innovat, Ottawa, ON K1N 6N5, Canada
关键词
SILICA; SIO2;
D O I
10.1140/epjd/e2013-30733-2
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Classical molecular dynamics (CMD) simulations were carried out to optimize silicon oxide interfaces with (100), (111), and (110) silicon surfaces. A three body interatomic potential (modified version of Stillinger-Weber) was used to model the interactions between the species. The resulting overall stress energies and average bond lengths and angles from CDM calculations were compared to previous density functional theory (DFT) calculations. The comparison yields similar trends in the stress energy and shows a good agreement for the bond lengths and angles. Perspectives for large scale molecular dynamics simulations on these systems are discussed.
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收藏
页数:5
相关论文
共 24 条
  • [1] Allen M. P., 1987, COMPUTER SIMULATION
  • [2] [Anonymous], 2001, Fundamental Aspects of Silicon Oxidation
  • [3] NEW CLASSICAL-MODELS FOR SILICON STRUCTURAL ENERGIES
    BISWAS, R
    HAMANN, DR
    [J]. PHYSICAL REVIEW B, 1987, 36 (12): : 6434 - 6445
  • [4] Structure and hyperfine parameters of E'(1) centers in a-quartz and in vitreous SiO2
    Boero, M
    Pasquarello, A
    Sarnthein, J
    Car, R
    [J]. PHYSICAL REVIEW LETTERS, 1997, 78 (05) : 887 - 890
  • [5] UNIFIED APPROACH FOR MOLECULAR-DYNAMICS AND DENSITY-FUNCTIONAL THEORY
    CAR, R
    PARRINELLO, M
    [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (22) : 2471 - 2474
  • [6] GARFUNKEL E, 1998, NATO SCI SERIES, V47
  • [7] ATOMISTIC CALCULATION OF OXYGEN DIFFUSIVITY IN CRYSTALLINE SILICON
    JIANG, Z
    BROWN, RA
    [J]. PHYSICAL REVIEW LETTERS, 1995, 74 (11) : 2046 - 2049
  • [8] Computational design of Si/SiO2 interfaces:: Stress and strain on the atomic scale
    Korkin, A
    Greer, JC
    Bersuker, G
    Karasiev, VV
    Bartlett, RJ
    [J]. PHYSICAL REVIEW B, 2006, 73 (16)
  • [9] Strain distribution around SiO2/Si interface in Si nanowires:: A molecular dynamics study
    Ohta, Hiromichi
    Watanabe, Takanobu
    Ohdomari, Iwao
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (5B): : 3277 - 3282
  • [10] Pantelidis S.T., 1978, PHYS SIO ITS INTERFA