Goodness-of-Fit Testing for Exponential Polynomial Growth Curves

被引:11
|
作者
Bhattacharya, Sabyasachi [2 ]
Basu, Ayanendranath [1 ]
Bandyopadhyay, Subhadip [3 ]
机构
[1] Indian Stat Inst, Bayesian & Interdisciplinary Res Unit, Kolkata 700108, India
[2] Indian Stat Inst, Agr & Ecol Res Unit, Kolkata 700108, India
[3] Infosys Technol Ltd, SET Labs, Hyderabad, Andhra Pradesh, India
关键词
Exponential model; Exponential polynomial family; Goodness-of-fit; Growth curve; LINEAR MIXED MODELS; LONGITUDINAL DATA; REGRESSION-MODELS; INDEX;
D O I
10.1080/03610920802209135
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
A goodness-of-fit test is proposed for the family of exponential polynomial growth curve models (EPGCM; Heinen, 1999), which has wide applications in different areas of science. The exponential growth curve model (EGCM), the most prominent member of the EPGCM family, is a simple and biologically meaningful growth model. Other members of the EPGCM family also cover many realistic growth processes. Thus, a goodness-of-fit test for the EPGCM class has substantial practical value. The goodness-of-fit test developed here is based on the properties of finite differences. The performance of the theory developed is illustrated through simulation and analysis of real data.
引用
收藏
页码:340 / 363
页数:24
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