Goodness-of-Fit Testing for Exponential Polynomial Growth Curves

被引：11

作者：

Bhattacharya, Sabyasachi ^{[2
]}

Basu, Ayanendranath ^{[1
]}

Bandyopadhyay, Subhadip ^{[3
]}

机构：

[1] Indian Stat Inst, Bayesian & Interdisciplinary Res Unit, Kolkata 700108, India

[2] Indian Stat Inst, Agr & Ecol Res Unit, Kolkata 700108, India

[3] Infosys Technol Ltd, SET Labs, Hyderabad, Andhra Pradesh, India

来源：

COMMUNICATIONS IN STATISTICS-THEORY AND METHODS | 2009年 / 38卷 / 03期

关键词：

Exponential model; Exponential polynomial family; Goodness-of-fit; Growth curve; LINEAR MIXED MODELS; LONGITUDINAL DATA; REGRESSION-MODELS; INDEX;

D O I：

10.1080/03610920802209135

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

A goodness-of-fit test is proposed for the family of exponential polynomial growth curve models (EPGCM; Heinen, 1999), which has wide applications in different areas of science. The exponential growth curve model (EGCM), the most prominent member of the EPGCM family, is a simple and biologically meaningful growth model. Other members of the EPGCM family also cover many realistic growth processes. Thus, a goodness-of-fit test for the EPGCM class has substantial practical value. The goodness-of-fit test developed here is based on the properties of finite differences. The performance of the theory developed is illustrated through simulation and analysis of real data.

引用

页码：340 / 363

页数：24

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