Device Scaling Considerations for Nanophotonic CMOS Global Interconnects

被引:36
|
作者
Manipatruni, Sasikanth [1 ]
Lipson, Michal [2 ,3 ]
Young, Ian A. [1 ]
机构
[1] Intel Corp, Components Res, Hillsboro, OR 97124 USA
[2] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14850 USA
[3] Kavli Inst Cornell, Ithaca, NY 14853 USA
关键词
Coupled resonators; integrated optics devices; integrated optoelectronic circuits; switching; SILICON ELECTROOPTIC SWITCH; HIGH-SPEED; WAVE-GUIDES; LOW-POWER; BANDWIDTH; PHOTODETECTORS; ELECTRONICS; TRANSCEIVER; TECHNOLOGY; COMPACT;
D O I
10.1109/JSTQE.2013.2239262
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We introduce an analytical framework to understand the path for scaling nanophotonic interconnects to meet the energy and footprint requirements of CMOS global interconnects. We derive the device requirements for sub-100 fJ/cm/bit interconnects including tuning power, serialization-deserialization energy, and optical insertion losses. Using CMOS with integrated nanophotonics as an example platform, we derive the energy/bit, linear, and areal bandwidth density of optical interconnects. We also derive the targets for device performance which indicate the need for continued improvements in insertion losses (<8 dB), laser efficiency, operational speeds (>40 Gb/s), tuning power (<100 mu W/nm), serialization-deserialization (<10 fJ/bit/Operation), and necessity for spectrally selective devices with wavelength multiplexing (>6 channels).
引用
收藏
页数:9
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