Deep Learning Enabled Laser Speckle Wavemeter with a High Dynamic Range

被引:64
作者
Gupta, Roopam K. [1 ,2 ]
Bruce, Graham D. [1 ]
Powis, Simon J. [2 ]
Dholakia, Kishan [1 ,3 ]
机构
[1] Univ St Andrews, Sch Phys & Astron, SUPA, St Andrews KY16 9SS, Fife, Scotland
[2] Univ St Andrews, Sch Med & Biomed Sci, Res Complex, St Andrews KY16 9TF, Fife, Scotland
[3] Yonsei Univ, Dept Phys, Coll Sci, Seoul 03722, South Korea
基金
英国工程与自然科学研究理事会;
关键词
automated noise rejection; deep learning; speckle metrology; wavelength measurement; HIGH-RESOLUTION; NEURAL-NETWORKS; MULTIMODE FIBER; RECOGNITION;
D O I
10.1002/lpor.202000120
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The speckle pattern produced when a laser is scattered by a disordered medium has recently been shown to give a surprisingly accurate or broadband measurement of wavelength. Here it is shown that deep learning is an ideal approach to analyze wavelength variations using a speckle wavemeter due to its ability to identify trends and overcome low signal to noise ratio in complex datasets. This combination enables wavelength measurement at high precision over a broad operating range in a single step, with a remarkable capability to reject instrumental and environmental noise, which has not been possible with previous approaches. It is demonstrated that the noise rejection capabilities of deep learning provide attometre-scale wavelength precision over an operating range from 488 nm to 976 nm. This dynamic range is six orders of magnitude beyond the state of the art.
引用
收藏
页数:8
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